Dae Hyun Kim

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 7

Top Topics

Random Access Memory

Room Temperature

Parameters Estimation

Top Venues

Microelectron. Reliab.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS (2018)
Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. (2017)
Dae Hyun Kim, Linda S. Milor
ECC-ASPIRIN: An ECC-assisted post-package repair scheme for aging errors in DRAMs. VTS (2016)
Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim, Linda Milor
Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. IEEE Trans. Very Large Scale Integr. Syst. 24 (7) (2016)
Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. Microelectron. Reliab. 55 (9-10) (2015)
Dae Hyun Kim, Soonyoung Cha, Linda S. Milor
AVERT: An elaborate model for simulating variable retention time in DRAMs. Microelectron. Reliab. 55 (9-10) (2015)
Dae Hyun Kim, Soonyoung Cha, Linda S. Milor
Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs. Microelectron. Reliab. 55 (9-10) (2015)