Woongrae Kim

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 6

Top Topics

Acoustic Emission

Hypothesis Test

Built In Self Test

Random Access Memory

Top Venues

Microelectron. Reliab.

Publications

Woongrae Kim, Chulmoon Jung, Seong Nyuh Yoo, Duckhwa Hong, Jeongjin Hwang, Jungmin Yoon, Oh-Yong Jung, Joonwoo Choi, Sanga Hyun, Mankeun Kang, Sangho Lee, Dohong Kim, Sanghyun Ku, Donhyun Choi, Nogeun Joo, Sangwoo Yoon, Junseok Noh, Byeongyong Go, Cheolhoe Kim, Sunil Hwang, Mihyun Hwang, Seol-Min Yi, Hyungmin Kim, Sanghyuk Heo, Yeonsu Jang, Kyoungchul Jang, Shinho Chu, Yoonna Oh, Kwidong Kim, Junghyun Kim, Soohwan Kim, Jeongtae Hwang, Sangil Park, Junphyo Lee, In-Chul Jeong, Joohwan Cho, Jonghwan Kim
A 1.1V 16Gb DDR5 DRAM with Probabilistic-Aggressor Tracking, Refresh-Management Functionality, Per-Row Hammer Tracking, a Multi-Step Precharge, and Core-Bias Modulation for Security and Reliability Enhancement. ISSCC (2023)
Woongrae Kim, Taizhi Liu, Linda Milor
On-line monitoring of system health using on-chip SRAMs as a wearout sensor. IOLTS (2017)
Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim, Linda Milor
Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. IEEE Trans. Very Large Scale Integr. Syst. 24 (7) (2016)
Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI (2015)
Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. VTS (2015)
Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. 55 (9-10) (2015)
Woongrae Kim, Linda Milor
Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells. VTS (2014)