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MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array.
Woongrae Kim
Chang-Chih Chen
Soonyoung Cha
Linda Milor
Published in:
VTS (2015)
Keyphrases
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hypothesis test
hypothesis testing
likelihood ratio
statistical tests
hypothesis tests
probability model
power consumption
random access memory
hypothesis verification
data transmission
statistical models
travel time
leakage current
image segmentation
transmission line
low power
statistical analysis