Soonyoung Cha

Publication Activity (10 Years)

Years Active: 2014-2017
Publications (10 Years): 9

Top Topics

Leakage Current

Gate Dielectrics

Hypothesis Test

Top Venues

Microelectron. Reliab.

Microprocess. Microsystems

Publications

Soonyoung Cha, Linda Milor
Adaptive supply voltage and duty cycle controller for yield-power optimization of ICs. IWASI (2017)
Soonyoung Cha, Taizhi Liu, Linda Milor
Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. IEEE Trans. Very Large Scale Integr. Syst. 25 (8) (2017)
Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. 55 (9-10) (2015)
Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI (2015)
Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. Microelectron. Reliab. 55 (9-10) (2015)
Dae Hyun Kim, Soonyoung Cha, Linda S. Milor
AVERT: An elaborate model for simulating variable retention time in DRAMs. Microelectron. Reliab. 55 (9-10) (2015)
Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems 39 (8) (2015)
Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. VTS (2015)
Dae Hyun Kim, Soonyoung Cha, Linda S. Milor
Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs. Microelectron. Reliab. 55 (9-10) (2015)
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS (2014)