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The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system.
Soonyoung Cha
Dae Hyun Kim
Taizhi Liu
Linda S. Milor
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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statistical model
experimental data
high level
mathematical model
parameter estimation
probabilistic model
probability distribution
computational model
em algorithm
formal model
theoretical framework
theoretical analysis
real time
multi view
cost function
machine learning
neural network