Taizhi Liu

Publication Activity (10 Years)

Years Active: 2014-2022
Publications (10 Years): 22

Top Topics

Silicon Dioxide

Multivariate Adaptive Regression Splines

Reliability Analysis

Top Venues

Microelectron. Reliab.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (9) (2022)
Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory. IEEE Trans. Very Large Scale Integr. Syst. 29 (5) (2021)
Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
Inverse Design of FinFET SRAM Cells. IRPS (2020)
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. 28 (3) (2020)
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor. IWASI (2019)
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. DCIS (2018)
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. VTS (2018)
Taizhi Liu, Chang-Chih Chen, Linda Milor
Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors. IEEE Trans. Emerg. Top. Comput. 6 (2) (2018)
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 26 (11) (2018)
Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS (2018)
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. Microelectron. Reliab. (2017)
Woongrae Kim, Taizhi Liu, Linda Milor
On-line monitoring of system health using on-chip SRAMs as a wearout sensor. IOLTS (2017)
Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. (2017)
Soonyoung Cha, Taizhi Liu, Linda Milor
Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. IEEE Trans. Very Large Scale Integr. Syst. 25 (8) (2017)
Chang-Chih Chen, Taizhi Liu, Linda Milor
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. IEEE Trans. Very Large Scale Integr. Syst. 24 (8) (2016)
Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. ICCD (2016)
Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. 55 (9-10) (2015)
Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI (2015)
Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. Microelectron. Reliab. 55 (9-10) (2015)
Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems 39 (8) (2015)
Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. 55 (9-10) (2015)
Taizhi Liu, Chang-Chih Chen, Linda S. Milor
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines. ISQED (2015)
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS (2014)