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Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology.

Kexin YangRui ZhangTaizhi LiuDae Hyun KimLinda Milor
Published in: DCIS (2018)
Keyphrases
  • parameters estimation
  • parameter estimation
  • image features
  • estimation algorithm
  • machine learning
  • computer vision
  • video sequences