Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms.
Rui ZhangKexin YangTaizhi LiuLinda MilorPublished in: DCIS (2018)
Keyphrases
- back end
- building blocks
- user friendly
- data management
- data types
- detailed design
- worst case
- version control
- estimation algorithm
- region of interest
- dynamic programming
- optimal segmentation
- test data
- estimation accuracy
- accurate estimation
- machine learning
- database
- data sets
- density distribution
- databases
- estimation error
- markov random field
- optimal solution
- lower bound
- closed form
- xml documents
- test cases
- edge detection