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Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements.
Soonyoung Cha
Chang-Chih Chen
Taizhi Liu
Linda S. Milor
Published in:
VTS (2014)
Keyphrases
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input output
electric field
information extraction
automatic extraction
room temperature
high speed
surface temperature
power system
circuit design
low variance
low voltage