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Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs.
Dae Hyun Kim
Soonyoung Cha
Linda S. Milor
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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leakage current
room temperature
low voltage
silicon dioxide
high temperature
built in self test
electrical properties
diesel engine
decision trees
fuel cell
information retrieval
variance reduction
embedded systems
trade off
surface temperature
power line
information systems
neural network