Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells.

Woongrae Kim Linda Milor

Published in: VTS (2014)

Keyphrases

back end
building blocks
user friendly
data management
data types
power consumption
user interface
fault diagnosis
data repositories
nearest neighbor
software engineering
version control
publish subscribe
built in self test
database systems
model based diagnosis
user experience
e government
information technology