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Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure.

Shu-Han HsuYing-Yuan HuangKexin YangLinda Milor
Published in: IOLTS (2019)
Keyphrases
  • failure modes
  • fault tree
  • data sets
  • high speed
  • training samples
  • analog circuits
  • genetic algorithm
  • website
  • training data
  • training set
  • fuzzy logic
  • sample set
  • spectral data
  • delay insensitive