Muhammad Bashir

Publication Activity (10 Years)

Years Active: 2009-2021
Publications (10 Years): 5

Top Topics

Flexible Manufacturing Systems

Top Venues

J. Control. Sci. Eng.

Microelectron. J.

Publications

Muhammad Bashir, Jian Zhou, Bashir Bala Muhammad
Optimal Supervisory Control for Flexible Manufacturing Systems Model With Petri Nets: A Place-Transition Control. IEEE Access 9 (2021)
Xun Li, Dandan Wu, Jingjing He, Muhammad Bashir, Liping Ma
An Improved Method of Particle Swarm Optimization for Path Planning of Mobile Robot. J. Control. Sci. Eng. 2020 (2020)
Muhammad Bashir
Optimal enforcement of liveness for decentralized systems of flexible manufacturing systems using Petri nets. Trans. Inst. Meas. Control 42 (12) (2020)
Muhammad Bashir, Zhiwu Li, Murat Uzam, Naiqi Wu, Abdulrahman Al-Ahmari
On structural reduction of liveness-enforcing Petri net supervisors for flexible manufacturing systems: an algebraic approach. IMA J. Math. Control. Inf. 35 (4) (2018)
Muhammad Bashir, Zhiwu Li, Murat Uzam, Abdulrahman Al-Ahmari, Naiqi Wu, Ding Liu, Ting Qu
A Minimal Supervisory Structure to Optimally Enforce Liveness on Petri Net Models for Flexible Manufacturing Systems. IEEE Access 5 (2017)
Shazia Bashir, Muhammad Bashir, Xavier Casadevall i Solvas, Julia M. Rees, William B. Zimmerman
Hydrophilic Surface Modification of PDMS Microchannel for O/W and W/O/W Emulsions. Micromachines 6 (10) (2015)
Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim
Simulation of system backend dielectric reliability. Microelectron. J. 45 (10) (2014)
Muhammad Bashir, Linda Milor, Dae Hyun Kim, Sung Kyu Lim
Impact of irregular geometries on low-k dielectric breakdown. Microelectron. Reliab. 51 (9-11) (2011)
Muhammad Bashir, Linda S. Milor, Dae Hyun Kim, Sung Kyu Lim
Methodology to determine the impact of linewidth variation on chip scale copper/low-k backend dielectric breakdown. Microelectron. Reliab. 50 (9-11) (2010)
Muhammad Bashir, Linda S. Milor
Towards a chip level reliability simulator for copper/low-k backend processes. DATE (2010)
Muhammad Bashir, Linda S. Milor
A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation. Microelectron. Reliab. 49 (9-11) (2009)
Muhammad Bashir, Linda Milor
Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements. IEEE Des. Test Comput. 26 (6) (2009)