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Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.
Chang-Chih Chen
Linda S. Milor
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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back end
data analysis
statistical analysis
user friendly
real time
machine learning
software aging
neural network
artificial intelligence
management system
high speed
data management
building blocks
data types
quantitative analysis
model validation