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Backend dielectric reliability simulator for microprocessor system.
Chang-Chih Chen
Fahad Ahmed
Dae Hyun Kim
Sung Kyu Lim
Linda Milor
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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back end
user friendly
data types
data management
building blocks
databases
publish subscribe
version control
database
data mining
data repositories
gate dielectrics