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Narumi Sakashita
Publication Activity (10 Years)
Years Active: 1988-1999
Publications (10 Years): 0
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Publications
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Hitoshi Tanaka
,
Masakazu Aoki
,
Takeshi Sakata
,
Shin'ichiro Kimura
,
Narumi Sakashita
,
Hideto Hidaka
,
Tadashi Tachibana
,
Katsutaka Kimura
A precise on-chip voltage generator for a gigascale DRAM with a negative word-line scheme.
IEEE J. Solid State Circuits
34 (8) (1999)
Ken'ichi Shimomura
,
Hiroki Shimano
,
Narumi Sakashita
,
Fumihiro Okuda
,
Toshiyuki Oashi
,
Yasuo Yamaguchi
,
Takahisa Eimori
,
Masahide Inuishi
,
Kazutami Arimoto
,
Shigeto Maegawa
,
Yasuo Inoue
,
Shinji Komori
,
Kazuo Kyuma
A 1-V 46-ns 16-Mb SOI-DRAM with body control technique.
IEEE J. Solid State Circuits
32 (11) (1997)
T. Iwamoto
,
S. Kobashi
,
Narumi Sakashita
,
J. Mitsuishi
,
Ken-ichi Tanaka
,
Kazuo Kyuma
Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms.
ICONIP (1)
(1997)
Narumi Sakashita
,
Fumihiro Okuda
,
Ken'ichi Shimomura
,
Hiroki Shimano
,
Mitsuhiro Hamada
,
Tetsuo Tada
,
Shinji Komori
,
Kazuo Kyuma
,
Akihiko Yasuoka
,
Haruhiko Abe
A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM.
ITC
(1996)
Narumi Sakashita
,
Yasuhiko Nitta
,
Ken'ichi Shimomura
,
Fumihiro Okuda
,
Hiroki Shimano
,
Satoshi Yamakawa
,
Masaki Tsukude
,
Kazutami Arimoto
,
Shinji Baba
,
Shinji Komori
,
Kazuo Kyuma
,
Akihiko Yasuoka
,
Haruhiko Abe
A 1.6-GB/s data-rate 1-Gb synchronous DRAM with hierarchical square-shaped memory block and distributed bank architecture.
IEEE J. Solid State Circuits
31 (11) (1996)
Eiichi Teraoka
,
Toru Kengaku
,
Ikuo Yasui
,
Kazuyuki Ishikawa
,
Takahiro Matsuo
,
Hideyuki Wakada
,
Narumi Sakashita
,
Yukihiko Shimazu
,
Takeshi Tokuda
A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC.
ITC
(1993)
Kazuo Nakamura
,
Narumi Sakashita
,
Yasuhiko Nitta
,
Ken'ichi Shimomura
,
Takeshi Tokuda
Fuzzy inference and fuzzy inference processor.
IEEE Micro
13 (5) (1993)
Narumi Sakashita
,
Hisako Sawai
,
Eiichi Teraoka
,
Toshiki Fugiyama
,
Toru Kengaku
,
Yukihiko Shimazu
,
Takeshi Tokuda
Built-in self-test in a 24 bit floating point digital signal processor.
ITC
(1990)
Takeshi Tokuda
,
Jiro Korematsu
,
Yukihiko Shimazu
,
Narumi Sakashita
,
Tohru Kengaku
,
Toshiki Fugiyama
,
Takio Ohno
,
Osamu Tomisawa
A macrocell approach for VLSI processor design.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
7 (12) (1988)