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Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms.
T. Iwamoto
S. Kobashi
Narumi Sakashita
J. Mitsuishi
Ken-ichi Tanaka
Kazuo Kyuma
Published in:
ICONIP (1) (1997)
Keyphrases
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genetic algorithm
neural network
latent semantic indexing
mobile devices
evolutionary algorithm
mobile applications
statistical significance
fuzzy logic
metaheuristic
fitness function
real time
information retrieval
learning algorithm
expert systems
multi objective
text retrieval