Tetsuo Tada

Publication Activity (10 Years)

Years Active: 1996-2004
Publications (10 Years): 0

Publications

Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada
I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium (2004)
Tetsuo Tada
Opportunities with the open architecture test system. ASP-DAC (2004)
Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada
Test cost reduction by at-speed BISR for embedded DRAMs. ITC (2001)
Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe
A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC (1996)