Haruhiko Abe

Publication Activity (10 Years)

Years Active: 1996-1996
Publications (10 Years): 0

Publications

Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe
A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC (1996)
Narumi Sakashita, Yasuhiko Nitta, Ken'ichi Shimomura, Fumihiro Okuda, Hiroki Shimano, Satoshi Yamakawa, Masaki Tsukude, Kazutami Arimoto, Shinji Baba, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe
A 1.6-GB/s data-rate 1-Gb synchronous DRAM with hierarchical square-shaped memory block and distributed bank architecture. IEEE J. Solid State Circuits 31 (11) (1996)