A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC.

Eiichi Teraoka Toru Kengaku Ikuo Yasui Kazuyuki Ishikawa Takahiro Matsuo Hideyuki Wakada Narumi Sakashita Yukihiko Shimazu Takeshi Tokuda

Published in: ITC (1993)

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