Jean-Luc Autran

Publication Activity (10 Years)

Years Active: 2010-2018
Publications (10 Years): 10

Top Topics

Poisson Process

Power Management

Top Venues

Microelectron. Reliab.

Publications

Yvan Debizet, Guénolé Lallement, Fady Abouzeid, Philippe Roche, Jean-Luc Autran
Q-Learning-based Adaptive Power Management for IoT System-on-Chips with Embedded Power States. ISCAS (2018)
Guenole Lallement, Fady Abouzeid, Thierry Di Gilio, Philippe Roche, Jean-Luc Autran
A 140 nW, 32.768 kHz, 1.9 ppm/°C Leakage-Based Digitally Relocked Clock Reference with 0.1 ppm Long-Term Stability in 28nm FD-SOI. A-SSCC (2018)
Guenole Lallement, Fady Abouzeid, Martin Cochet, Jean-Marc Daveau, Philippe Roche, Jean-Luc Autran
A 2.7 pJ/cycle 16 MHz, 0.7 µW Deep Sleep Power ARM Cortex-M0+ Core SoC in 28 nm FD-SOI. IEEE J. Solid State Circuits 53 (7) (2018)
Guenole Lallement, Fady Abouzeid, Martin Cochet, Jean-Marc Daveau, Philippe Roche, Jean-Luc Autran
A 2.7pJ/cycle 16MHz SoC with 4.3nW power-off ARM Cortex-M0+ core in 28nm FD-SOI. ESSCIRC (2017)
S. Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche
Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. Microelectron. Reliab. (2017)
Daniela Munteanu, Jean-Luc Autran, S. Moindjie
Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation. Microelectron. Reliab. (2017)
Martin Cochet, Sylvain Clerc, Guenole Lallement, Fady Abouzeid, Philippe Roche, Jean-Luc Autran
voltage scalable digital frequency generator for SoC clocking. A-SSCC (2017)
Martin Cochet, Alberto Puggelli, Ben Keller, Brian Zimmer, Milovan Blagojevic, Sylvain Clerc, Philippe Roche, Jean-Luc Autran, Borivoje Nikolic
On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC. A-SSCC (2016)
T. Saad Saoud, S. Moindjie, Daniela Munteanu, Jean-Luc Autran
Natural radiation events in CCD imagers at ground level. Microelectron. Reliab. 64 (2016)
Martin Cochet, Sylvain Clerc, Mehdi Naceur, Pierre Schamberger, Damien Croain, Jean-Luc Autran, Philippe Roche
A 28nm FD-SOI standard cell 0.6-1.2V open-loop frequency multiplier for low power SoC clocking. ISCAS (2016)
Daniela Munteanu, Jean-Luc Autran
SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation. Microelectron. Reliab. 55 (9-10) (2015)
Jean-Luc Autran, Daniela Munteanu, S. Moindjie, T. Saad Saoud, S. Sauze, Gilles Gasiot, Philippe Roche
ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure. Microelectron. Reliab. 55 (9-10) (2015)
Daniela Munteanu, Jean-Luc Autran
3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs. Microelectron. Reliab. 55 (9-10) (2015)
Jean-Luc Autran, Daniela Munteanu
Radiation and COTS at ground level. Microelectron. Reliab. 55 (9-10) (2015)
Victor Malherbe, Gilles Gasiot, Dimitri Soussan, Aurelien Patris, Jean-Luc Autran, Philippe Roche
Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis. IRPS (2015)
Gilles Gasiot, Dimitri Soussan, Jean-Luc Autran, Victor Malherbe, Philippe Roche
Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs. IRPS (2015)
Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. Microelectron. Reliab. 54 (9-10) (2014)
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot
Real-time soft-error rate measurements: A review. Microelectron. Reliab. 54 (8) (2014)
Daniela Munteanu, Jean-Luc Autran
Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation. Microelectron. Reliab. 54 (9-10) (2014)
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, P. Loaiza, G. Warot, M. Zampaolo
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. Microelectron. Reliab. 50 (9-11) (2010)