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Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level.

Jean-Luc AutranDaniela MunteanuPhilippe RocheGilles GasiotS. MartinieS. UznanskiS. SauzeS. SemikhEvgeny YakushevS. RozovP. LoaizaG. WarotM. Zampaolo
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • memory requirements
  • high speed
  • levels of abstraction
  • real world
  • case study
  • search algorithm
  • higher level
  • information processing
  • prediction error
  • error analysis
  • artificial systems
  • delay insensitive
  • shift register