Gilles Gasiot

Publication Activity (10 Years)

Years Active: 2008-2017
Publications (10 Years): 2

Top Topics

Integrated Circuit

Poisson Process

Top Venues

Microelectron. Reliab.

Publications

S. Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche
Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. Microelectron. Reliab. (2017)
Fady Abouzeid, Christophe Bernicot, Sylvain Clerc, Jean-Marc Daveau, Gilles Gasiot, Daniel Noblet, Dimitri Soussan, Philippe Roche
-A53 using static biasing-anticipation. ESSCIRC (2016)
Fady Abouzeid, Sylvain Clerc, Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Damien Croain, Gilles Gasiot, Dimitri Soussan, Philippe Roche
28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processors. ESSCIRC (2015)
Jean-Luc Autran, Daniela Munteanu, S. Moindjie, T. Saad Saoud, S. Sauze, Gilles Gasiot, Philippe Roche
ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure. Microelectron. Reliab. 55 (9-10) (2015)
Victor Malherbe, Gilles Gasiot, Dimitri Soussan, Aurelien Patris, Jean-Luc Autran, Philippe Roche
Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis. IRPS (2015)
Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, Fady Abouzeid, Sylvain Clerc, Lirida A. B. Naviner, Philippe Roche
Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test. IRPS (2015)
Gilles Gasiot, Dimitri Soussan, Jean-Luc Autran, Victor Malherbe, Philippe Roche
Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs. IRPS (2015)
Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. Microelectron. Reliab. 54 (9-10) (2014)
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot
Real-time soft-error rate measurements: A review. Microelectron. Reliab. 54 (8) (2014)
Sylvain Clerc, Fady Abouzeid, Gilles Gasiot, David Gauthier, Philippe Roche
A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error tolerance. ESSCIRC (2012)
Sylvain Clerc, Fady Abouzeid, Gilles Gasiot, David Gauthier, Dimitri Soussan, Philippe Roche
A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance. ICICDT (2012)
Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, P. Loaiza, G. Warot, M. Zampaolo
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. Microelectron. Reliab. 50 (9-11) (2010)
Philippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche
Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS. IOLTS (2008)