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Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test.

Cyril BottoniBenjamin CoefficJean-Marc DaveauGilles GasiotFady AbouzeidSylvain ClercLirida A. B. NavinerPhilippe Roche
Published in: IRPS (2015)
Keyphrases
  • x ray
  • high speed
  • infrared
  • metal oxide
  • power system
  • wavelet transform
  • low frequency
  • ieee bus
  • spectral density