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Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis.

Victor MalherbeGilles GasiotDimitri SoussanAurelien PatrisJean-Luc AutranPhilippe Roche
Published in: IRPS (2015)
Keyphrases
  • error rate
  • test set
  • statistical analysis
  • multi class
  • machine learning
  • pattern recognition
  • cost sensitive classification
  • misclassification rate
  • false discovery rate