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Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs.
Gilles Gasiot
Dimitri Soussan
Jean-Luc Autran
Victor Malherbe
Philippe Roche
Published in:
IRPS (2015)
Keyphrases
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silicon on insulator
infrared
room temperature
neural network
finite element analysis
power plant
injection lasers
face recognition
low cost
cmos technology
transmission electron microscopy
thermal conductivity
solder ball connect