Maximilien Glorieux

Publication Activity (10 Years)

Years Active: 2014-2021
Publications (10 Years): 20

Top Topics

Graph Representations

Top Venues

Publications

Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. CoRR (2021)
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. CoRR (2021)
Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin, Thomas Lange, Maximilien Glorieux
Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis. ISQED (2021)
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. CoRR (2021)
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. CoRR (2021)
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. CoRR (2020)
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. CoRR (2020)
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. IOLTS (2020)
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. MECO (2020)
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. CoRR (2020)
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. CoRR (2020)
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. IOLTS (2020)
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. NORCAS (2019)
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. DTIS (2019)
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. IOLTS (2019)
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. AHS (2019)
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. DSN (Supplements) (2019)
Luca Sterpone, Sarah Azimi, Ludovica Bozzoli, Boyang Du, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Cesar Boatella Polo, David Merodio Codinachs
A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs. AHS (2018)
Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal
EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety. IOLTS (2017)
Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux
A call for cross-layer and cross-domain reliability analysis and management. IOLTS (2015)
Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. Microelectron. Reliab. 54 (9-10) (2014)