Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits.
Thomas LangeAneesh BalakrishnanMaximilien GlorieuxDan AlexandrescuLuca SterponePublished in: IOLTS (2019)
Keyphrases
- machine learning
- real world
- feature selection
- lessons learned
- information extraction
- explanation based learning
- key issues
- support vector machine
- knowledge representation
- learning algorithm
- bayesian networks
- high level
- real time
- text classification
- steady state
- learning problems
- natural language
- machine learning algorithms
- learning systems
- machine learning methods
- e learning
- complex data
- data mining
- open issues