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On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques.

Thomas LangeAneesh BalakrishnanMaximilien GlorieuxDan AlexandrescuLuca Sterpone
Published in: DSN (Supplements) (2019)
Keyphrases
  • failure rate
  • machine learning
  • high speed
  • complex systems
  • real world
  • test set
  • power consumption
  • confidence intervals