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On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques.
Thomas Lange
Aneesh Balakrishnan
Maximilien Glorieux
Dan Alexandrescu
Luca Sterpone
Published in:
DSN (Supplements) (2019)
Keyphrases
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failure rate
machine learning
high speed
complex systems
real world
test set
power consumption
confidence intervals