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Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs.

S. MoindjieJean-Luc AutranDaniela MunteanuGilles GasiotPhilippe Roche
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • error rate
  • poisson process
  • test set
  • markov modulated
  • noise level
  • face recognition
  • model selection
  • misclassification rate
  • poisson processes
  • bayesian networks
  • equal error rate