Login / Signup

Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation.

Daniela MunteanuJean-Luc AutranS. Moindjie
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • field effect transistors
  • steady state
  • nano scale
  • mathematical analysis
  • simulation models
  • real time
  • search engine
  • information systems
  • cmos technology