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SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation.
Daniela Munteanu
Jean-Luc Autran
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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computer aided design
neural network
computer vision
sensitivity analysis
numerical simulations
simulation model
data transmission
simulation environment