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Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation.
Daniela Munteanu
Jean-Luc Autran
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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numerical simulations
theoretical analysis
x ray
leakage current
infrared
numerical calculation
temperature field
power consumption
finite element method
simulation data
computational fluid dynamics
lattice boltzmann
neural network
computer vision
fluid dynamics
low voltage
cmos technology