Hajdin Ceric

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 3

Top Topics

Distribution Function

Statistical Models

Top Venues

Microelectron. Reliab.

Publications

A. S. Saleh, Houman Zahedmanesh, Hajdin Ceric, Ingrid De Wolf, Kris Croes
Impact of via geometry and line extension on via-electromigration in nano-interconnects. IRPS (2023)
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics. ESSDERC (2022)
Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer, Florian Rudolf, Karl Rupp, Hubert Enichlmair, J. H. Park, Hajdin Ceric, Tibor Grasser
Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. Microelectron. Reliab. 55 (9-10) (2015)
Wolfhard H. Zisser, Hajdin Ceric, Josef Weinbub, Siegfried Selberherr
Electromigration reliability of open TSV structures. Microelectron. Reliab. 54 (9-10) (2014)
Anderson Pires Singulani, Hajdin Ceric, Siegfried Selberherr
Stress evolution in the metal layers of TSVs with Bosch scallops. Microelectron. Reliab. 53 (9-11) (2013)
Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr
Electromigration failure in a copper dual-damascene structure with a through silicon via. Microelectron. Reliab. 52 (9-10) (2012)
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr
Interconnect reliability dependence on fast diffusivity paths. Microelectron. Reliab. 52 (8) (2012)
R. L. de Orio, Hajdin Ceric, Siegfried Selberherr
A compact model for early electromigration failures of copper dual-damascene interconnects. Microelectron. Reliab. 51 (9-11) (2011)
Lado Filipovic, Hajdin Ceric, Johann Cervenka, Siegfried Selberherr
A simulator for local anodic oxidation of silicon surfaces. CCECE (2011)
Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51 (9-11) (2011)
R. L. de Orio, Hajdin Ceric, Siegfried Selberherr
Physically based models of electromigration: From Black's equation to modern TCAD models. Microelectron. Reliab. 50 (6) (2010)
Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50 (9-11) (2010)
Hajdin Ceric, Siegfried Selberherr
Simulative prediction of the resistance change due to electromigration induced void evolution. Microelectron. Reliab. 42 (9-11) (2002)