Sara Carniello

Publication Activity (10 Years)

Years Active: 2007-2019
Publications (10 Years): 2

Top Topics

Error Accumulation

Top Venues

Microelectron. Reliab.

Publications

Lorenzo Benvenuti, Paolo Bruschi, Luca Fanucci, Raffaele Coppeta, Sara Carniello, Luigi Di Piro, Francesco Tinfena
Modelling and measurements of thermomechanical stress induced drift on polysilicon resistors with different layout. DTIS (2019)
Lado Filipovic, Anderson Pires Singulani, Frederic Roger, Sara Carniello, Siegfried Selberherr
Intrinsic stress analysis of tungsten-lined open TSVs. Microelectron. Reliab. 55 (9-10) (2015)
Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50 (9-11) (2010)
Hubert Enichlmair, Sara Carniello, Jong Mun Park, Rainer Minixhofer
Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor. Microelectron. Reliab. 47 (9-11) (2007)