Ivan A. Starkov

Publication Activity (10 Years)

Years Active: 2009-2023
Publications (10 Years): 2

Top Topics

Thresholding Algorithm

Analytical Model

Top Venues

J. Comput. Appl. Math.

Microelectron. Reliab.

Publications

Ivan A. Starkov, D. A. Pavlov, Sergey Tikhomirov, Fedor Bakharev
The non-monotonicity of growth rate of viscous fingers in heterogeneous porous media. CoRR (2023)
F. Bakharev, Alexsandr Enin, A. Groman, A. Kalyuzhnyuk, S. Matveenko, Yulia Petrova, Ivan A. Starkov, Sergey Tikhomirov
Velocity of viscous fingers in miscible displacement: Comparison with analytical models. J. Comput. Appl. Math. 402 (2022)
Ivan A. Starkov, Alexander S. Starkov
Investigation of the threshold voltage turn-around effect in long-channel n-MOSFETs due to hot-carrier stress. Microelectron. Reliab. 54 (1) (2014)
Ivan A. Starkov, Alexander S. Starkov
A Semi-numerical Approach to Radiation Boundary Conditions. NMA (2014)
Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51 (9-11) (2011)
Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50 (9-11) (2010)
Stanislav Tyaginov, Viktor Sverdlov, Ivan A. Starkov, Wolfgang Gös, Tibor Grasser
Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate. Microelectron. Reliab. 49 (9-11) (2009)