• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

An analytical approach for physical modeling of hot-carrier induced degradation.

Stanislav TyaginovIvan A. StarkovHubert EnichlmairC. JungemannJong Mun ParkEhrenfried SeebacherR. L. de OrioHajdin CericTibor Grasser
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • real time
  • neural network
  • multiscale
  • data model
  • database
  • real world
  • data mining
  • information systems
  • face recognition
  • digital libraries
  • multiresolution
  • mobile robot
  • statistical modeling