• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.

Stanislav TyaginovViktor SverdlovIvan A. StarkovWolfgang GösTibor Grasser
Published in: Microelectron. Reliab. (2009)
Keyphrases