Interface traps density-of-states as a vital component for hot-carrier degradation modeling.
Stanislav TyaginovIvan A. StarkovOliver TrieblJohann CervenkaC. JungemannSara CarnielloJong Mun ParkHubert EnichlmairMarkus KarnerCh. KernstockEhrenfried SeebacherRainer MinixhoferHajdin CericTibor GrasserPublished in: Microelectron. Reliab. (2010)