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Interface traps density-of-states as a vital component for hot-carrier degradation modeling.

Stanislav TyaginovIvan A. StarkovOliver TrieblJohann CervenkaC. JungemannSara CarnielloJong Mun ParkHubert EnichlmairMarkus KarnerCh. KernstockEhrenfried SeebacherRainer MinixhoferHajdin CericTibor Grasser
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • user interface
  • modeling method
  • database
  • real time
  • neural network
  • learning algorithm
  • similarity measure
  • multi agent
  • high speed
  • finite state machines
  • graphical interface