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Investigation of the threshold voltage turn-around effect in long-channel n-MOSFETs due to hot-carrier stress.
Ivan A. Starkov
Alexander S. Starkov
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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low voltage
multi channel
neural network
information systems
artificial neural networks
genetic algorithm
power system
power consumption
threshold selection
field effect transistors
thresholding algorithm