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Investigation of the threshold voltage turn-around effect in long-channel n-MOSFETs due to hot-carrier stress.

Ivan A. StarkovAlexander S. Starkov
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • low voltage
  • multi channel
  • neural network
  • information systems
  • artificial neural networks
  • genetic algorithm
  • power system
  • power consumption
  • threshold selection
  • field effect transistors
  • thresholding algorithm