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Modelling and measurements of thermomechanical stress induced drift on polysilicon resistors with different layout.

Lorenzo BenvenutiPaolo BruschiLuca FanucciRaffaele CoppetaSara CarnielloLuigi Di PiroFrancesco Tinfena
Published in: DTIS (2019)
Keyphrases
  • random access memory
  • design considerations
  • database
  • error accumulation
  • databases
  • power consumption
  • concept drift
  • low voltage