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Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.

Prateek SharmaStanislav TyaginovYannick WimmerFlorian RudolfKarl RuppHubert EnichlmairJ. H. ParkHajdin CericTibor Grasser
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • distribution function
  • statistical models
  • statistical analysis
  • random variables
  • data mining
  • image sequences
  • prior knowledge
  • higher order
  • maximum likelihood
  • bayesian framework