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Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits.

Reisuke ShimodaTakaki YoshidaMasafumi WatariYasuhiro ToyotaKiyokazu NishiAkira Motohara
Published in: Asian Test Symposium (1999)
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