Masafumi Watari

Publication Activity (10 Years)

Years Active: 1999-2015
Publications (10 Years): 0

Top Topics

Robotic Manipulator

Top Venues

Publications

Daisuke Arai, Tomohiko Ogishi, Masafumi Watari, Shigehiro Ano, Masakatsu Nishigaki, Hiroshi Mineno
UE-based network access timing control scheme for avoiding signaling spikes. ICC (2015)
Masafumi Watari, Atsushi Tagami, Shigehiro Ano
Evaluating the Performance of Locator/ID Separation Based on LISP Map Cache Emulation. SAINT (2012)
Masafumi Watari, Peng Jiang, Atsuo Tachibana, Shigehiro Ano
A Method for Real-Time Identification of Malformed BGP Messages. SAINT (2011)
Masafumi Watari, Atsuo Tachibana, Shigehiro Ano
Inferring the Origin of Routing Changes Based on Preferred Path Changes. PAM (2011)
Masafumi Watari, Yuichiro Hei, Shigehiro Ano, Katsuyuki Yamazaki
OSPF-Based Fast Reroute for BGP Link Failures. GLOBECOM (2009)
Masafumi Watari, Yuichiro Hei, Shigehiro Ano, Katsuyuki Yamazaki
Improving the Sustainability of Autonomous Systems. ICN (2008)
Chan-Wah Ng, Fan Zhao, Masafumi Watari, Pascal Thubert
Network Mobility Route Optimization Solution Space Analysis. RFC 4889 (2007)
Chan-Wah Ng, Pascal Thubert, Masafumi Watari, Fan Zhao
Network Mobility Route Optimization Problem Statement. RFC 4888 (2007)
Masafumi Watari, Atsushi Tagami, Teruyuki Hasegawa, Shigehiro Ano
A Scalable and Efficient Client Emulation Method for IP Multicast Performance Evaluation. AINA Workshops (1) (2007)
Masafumi Watari, Thierry Ernst, Ryuji Wakikawa, Jun Murai
Routing Optimization for Nested Mobile Networks. IEICE Trans. Commun. (10) (2006)
Takaki Yoshida, Masafumi Watari
A New Solution to Power Supply Voltage Drop Problems in Scan Testing. IEICE Trans. Inf. Syst. (3) (2004)
Takaki Yoshida, Masafumi Watari
A New Approach for Low Power Scan Testing. ITC (2003)
Takaki Yoshida, Masafumi Watari
MD-SCAN Method for Low Power Scan Testing. Asian Test Symposium (2002)
Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara
Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. Asian Test Symposium (1999)