A New Approach for Low Power Scan Testing.

Takaki Yoshida Masafumi Watari

Published in: ITC (2003)

Keyphrases

low power
low cost
power consumption
high speed
single chip
high power
wireless transmission
vlsi circuits
real time
logic circuits
low power consumption
vlsi architecture
digital signal processing
gate array
image sensor
delay insensitive
embedded systems
digital camera
signal processor
ultra low power