Takaki Yoshida

Publication Activity (10 Years)

Years Active: 1997-2004
Publications (10 Years): 0

Publications

Takaki Yoshida, Masafumi Watari
A New Solution to Power Supply Voltage Drop Problems in Scan Testing. IEICE Trans. Inf. Syst. (3) (2004)
Takaki Yoshida, Masafumi Watari
A New Approach for Low Power Scan Testing. ITC (2003)
Takaki Yoshida, Masafumi Watari
MD-SCAN Method for Low Power Scan Testing. Asian Test Symposium (2002)
Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara
Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. Asian Test Symposium (1999)
Takaki Yoshida, Reisuke Shimoda, Takashi Mizokawa, Katsuhiro Hirayama
An effective fault simulation method for core based LSI. Asian Test Symposium (1997)