INDUSTRIAL SYSTEMS
Experts
- Xuefeng Chen
- Jong-Myon Kim
- Weihua Li
- Krishnendu Chakrabarty
- Marios M. Polycarpou
- Zhongkui Zhu
- Lei Shu
- Steven X. Ding
- Yu Zhang
- Chuan Li
- Krishna R. Pattipati
- Janusz Rajski
- Sudhakar M. Reddy
- Pabitra Mohan Khilar
- Khashayar Khorasani
- Irith Pomeranz
- Shen Yin
- Jing Lin
- Mourad Elhadef
- Jinde Zheng
- Orestes Llanes-Santiago
- Xingxing Jiang
- Haidong Shao
- Fengshou Gu
- Weiguo Huang
- Jinrui Wang
- Changqing Shen
- Haiyang Pan
- Xiaoan Yan
- Ruqiang Yan
- Shunming Li
- Silvio Simani
- Thomas Parisini
- Shaohui Zhang
- Hongxia Pan
- Yigang He
- Jiafu Wan
- Zhaobo Zhang
- Andrew D. Ball
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- CoRR
- IEEE Trans. Ind. Informatics
- IEEE Trans. Ind. Electron.
- Expert Syst. Appl.
- Entropy
- Neurocomputing
- ETFA
- Reliab. Eng. Syst. Saf.
- Complex.
- IECON
- ACC
- Eng. Appl. Artif. Intell.
- ITC
- IEEE Trans. Computers
- CDC
- ECC
- J. Intell. Fuzzy Syst.
- Autom.
- Appl. Soft Comput.
- Comput. Chem. Eng.
- Knowl. Based Syst.
- SMC
- I2MTC
- CASE
- Neural Comput. Appl.
- J. Intell. Manuf.
- ICPHM
- INDIN
- Appl. Intell.
- DATE
- Comput. Ind. Eng.
- Asian Test Symposium
- Adv. Eng. Informatics
- SAFEPROCESS
- Comput. Ind.
- IJCNN
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