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Experts
- Tomás Pajdla
- Zuzana Kukelova
- Daniel Barath
- Zhanyi Hu
- João Pedro Barreto
- Ralph Ewerth
- Yisong Chen
- Tamás Szirányi
- Nassir Navab
- Peter F. Sturm
- Martin Bujnak
- Ezio Malis
- Xianghua Ying
- Anders Heyden
- Michal Polic
- Marc Pollefeys
- Richard I. Hartley
- Hongbin Zha
- Edmond Boyer
- Zoltan Kato
- Chandra Kambhamettu
- Marie-Odile Berger
- Yuncai Liu
- Laszlo Havasi
- Horace Ho-Shing Ip
- Wolfgang Förstner
- Sudipta N. Sinha
- Amnon Shashua
- Mubarak Shah
- Sanjeev J. Koppal
- Camillo J. Taylor
- Javier-Flavio Vigueras
- Guanghui Wang
- Gilles Simon
- Zoltán Szlávik
- Derek A. Paley
- Slobodan Ilic
- Danda Pani Paudel
- Hassan Foroosh
Venues
- CoRR
- CVPR
- IROS
- ICCV
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Pattern Recognit.
- ICPR
- IEEE Trans. Image Process.
- IEEE Access
- BMVC
- J. Electronic Imaging
- Int. J. Comput. Vis.
- IEEE Trans. Autom. Control.
- CVPR (1)
- ICPR (1)
- WACV
- Sensors
- Mach. Vis. Appl.
- MVA
- Pattern Recognit. Lett.
- ECCV (2)
- AVSS
- IEEE Trans. Instrum. Meas.
- 3DV
- CVPR Workshops
- IGARSS
- Discret. Math.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Robotics Autom. Lett.
- Remote. Sens.
- J. Robotics Mechatronics
- ECCV (1)
- Comput. Vis. Image Underst.
- IEEE Trans. Geosci. Remote. Sens.
- J. Math. Imaging Vis.
- CAIP
- EUSIPCO
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