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Experts
- Thomas S. Huang
- Patrick Bouthemy
- Rama Chellappa
- Dmitry B. Goldgof
- Olivier D. Faugeras
- Mubarak Shah
- Michael J. Black
- Amit K. Sanyal
- Yiannis Aloimonos
- Hans-Hellmut Nagel
- Takeo Kanade
- Joris De Schutter
- Marc Pollefeys
- Luc Van Gool
- Robert E. Mahony
- Seiichiro Katsura
- Daniel Rueckert
- Didier Stricker
- Yoshihiko Nakamura
- Stefano Soatto
- Carlo Tomasi
- Adrien Bartoli
- Narendra Ahuja
- Shmuel Peleg
- Claude Jauffret
- Roberto Cipolla
- Boudewijn P. F. Lelieveldt
- Milan Sonka
- Johan H. C. Reiber
- Kostas Daniilidis
- Heinz Handels
- Andrés Bruhn
- Nicholas Ayache
- Yoshiaki Shirai
- David William Murray
- Masayuki Inaba
- Derek A. Paley
- Christoph Schnörr
- Anders Heyden
Venues
- CoRR
- ICRA
- IROS
- CVPR
- Sensors
- ICIP
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACC
- IEEE Access
- ICASSP
- CDC
- BMVC
- ICPR
- EMBC
- Int. J. Comput. Vis.
- IEEE Trans. Image Process.
- Image Vis. Comput.
- ROBIO
- ACM Trans. Graph.
- Pattern Recognit.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Robotics Autom. Lett.
- Comput. Vis. Image Underst.
- FUSION
- Remote. Sens.
- EUSIPCO
- IEEE Trans. Instrum. Meas.
- Pattern Recognit. Lett.
- IGARSS
- SMC
- ISBI
- Autom.
- WACV
- CVPR Workshops
- IEEE Trans. Medical Imaging
- ICIP (2)
- MVA
- IEEE Trans. Robotics
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