DENSE DEPTH MAPS
Experts
- Lina Liu
- Werner Ritter
- Frank D. Julca-Aguilar
- Felix Heide
- Kwanghoon Sohn
- Mengmeng Wang
- Mario Bijelic
- Tobias Gruber
- Stefanie Walz
- Rui Fan
- Yong Liu
- Laurent Kneip
- Shigeo Morishima
- Nicholas A. Lord
- Chang-Su Kim
- Qi Feng
- Ruigang Yang
- Zhiguo Cao
- Oliver Wang
- Larry H. Matthies
- Xibin Song
- Seungryong Kim
- Klaus Dietmayer
- Alexander Liniger
- Vaishakh Patil
- Hubert P. H. Shum
- Sergiu Nedevschi
- Stuart Golodetz
- David William Murray
- Luc Van Gool
- Victor Adrian Prisacariu
- Philip H. S. Torr
- Tommaso Cavallari
- Paul Koppen
- Xianke Lin
- Tianqi Zhao
- Camillo J. Taylor
- Jan Obdrzálek
- John D. Martin
Venues
- CoRR
- CVPR
- ICRA
- ICCV
- ICIP
- IROS
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Robotics Autom. Lett.
- BMVC
- Remote. Sens.
- ISCAS
- ROBIO
- VISIGRAPP (5: VISAPP)
- CVPR Workshops
- ICASSP
- IEEE Access
- Multim. Tools Appl.
- IJCAI
- IEEE Signal Process. Lett.
- Pattern Recognit. Lett.
- WACV
- IEEE Trans. Image Process.
- ITSC
- Comput. Graph. Forum
- Image Vis. Comput.
- Vis. Comput.
- MVA
- ICPR
- IEEE Trans. Instrum. Meas.
- 3DTV-Conference
- ACCV (2)
- SIU
- APSIPA
- J. Electronic Imaging
- SMC
- ICNC-FSKD
- VCIP
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